A Data Mining Perspective of XRF Elemental Analysis from Pueblo People’s Pottery

 

• M. Castro-Colin
  Bruker AXS GmbH, Karlsruhe-76131, Germany
• E. Ramirez-Homs
  Department of Physics, El Paso, TX-79912, USA
• J. A. López
  Department of Physics, El Paso, TX-79912, USA

DOI: https://doi.org/10.15415/jnp.2020.72016

Keywords: X-ray fluorescence, Radiation, Spectrometry, Cluster Analysis, Data Mining, Archaeology, Provenance, Nondestructive testing analysis

Abstract

Hierarchichal clustering was used to identify elemental signatures in artifacts attributed to the Pueblo peoples. The artifacts in this study are pottery samples found at different sites in the state of New Mexico, USA. Three methods were applied: complete, average, and Ward. Their corresponding cophenetic correlation coefficients were used to contrast the three methods. Elemental characterization was only based on X-ray fluorescence excitation from a portable spectrometer with silver anode. The elemental correlations here disclosed by data mining techniques are expected to guide further archaelogical studies and assist experts in the assessment of provenance and historical ethnographic studies.

 

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Issue

Vol 7 No 2 (2020): Special Issue

 

How to Cite

M. Castro-Colin; E. Ramirez-Homs; J. A. López. A Data Mining Perspective of XRF Elemental Analysis from Pueblo People’s Pottery. J. Nucl. Phy. Mat. Sci. Rad. A. 2020, 7, 129-138.

Temperature Effects in the Composition of Metal Halide Perovskite thin Films

 

• M. Castro-ColinBruker AXS, Karlsruhe, Germany
• L. BanuelosDept. of Physics, U. of Texas at El Paso, El Paso, TX, USA
• C. Diaz-MorenoDept. of Physics, U. of Texas at El Paso, El Paso, TX, USA
• D. HodgesElectrical and Computer Eng. Dept., U. of Texas at El Paso, El Paso, TX, USA
• E. Ramirez-HomsDept. of Physics, U. of Texas at El Paso, El Paso, TX, USA
• D. KorolkovBruker AXS, Karlsruhe, Germany
• N. SharminDept. of Physics, U. of Texas at El Paso, El Paso, TX, USA
• J. A. LopezDept. of Physics, U. of Texas at El Paso, El Paso, TX, USA

DOI: https://doi.org/10.15415/jnp.2018.61007

Keywords: Perovskites, Photovoltaic, Energy Conversion, X-ray Reflectivity, X-ray Fluorescence

Abstract

Metal halide perovskites have shown to be a structure with great promise as an efficient photovoltaic, but at the same time it is affected by instability problems that degrade their performance. Degradation mechanisms vary with temperature, moisture, oxidation, and energy conversion during light exposure. We study performance loss due to temperature by probing diffusion of elemental composition across the thickness of films produced by spin coating and for temperatures ranging from 20 to 200°C. X-ray reflectivity was used to identify the electron density, composition, and quality of the films, aided with X-ray fluorescence and X-ray photoelectron spectroscopy studies to obtain information about degradation of the organic phase of the films.

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Issue

Vol 6 No 1 (2018)

How to Cite

M. Castro-Colin; L. Banuelos; C. Diaz-Moreno; D. Hodges; E. Ramirez-Homs; D. Korolkov; N. Sharmin; J. A. Lopez. Temperature Effects in the Composition of Metal Halide Perovskite Thin Films. J. Nucl. Phy. Mat. Sci. Rad. A. 2018, 6, 39-49.