Experimental Setups for Single Event Effect Studies

DOI

10.15415/jnp.2016.41002

AUTHORS

N. H. Medina, V. A. P. Aguiar, N. Added, F. Aguirre, E. L. A. Macchione, S. G. Alberton, M. A. G. Silve ira, J. Benfica, F. Vargas, B. Porcher

ABSTRACT

Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the São Paulo 8 UD Pelletron accelerator were prepared. This accelerator produces proton beams and heavy ion beams up to 107Ag. A Super conducting Linear accelerator, which is under construction, may fulfill all of the European Space Agency requirements to qualify electronic components for SEE.

KEYWORDS

Radiation effects, electronic devices, single event effects.

LINK: http://jnp.chitkara.edu.in/abstract.php?id=470#exactabstracts

REFERENCES

• Aguiar, V.A.P., et al., “Experimental Setup for Single Event Effects at Sao Paulo Pelletron Accelerator” Nucl. Inst. Meth. Phys. Res. B., 332, p. 397, 2014. http://dx.doi.org/10.1016/j.nimb.2014.02.105
• Barnaby, H.J., “Total-Ionization-Dose Effects in Modern CMOS Technologies”, IEEE Transactions on Nuclear Science, vol. 53, no. 6, p. 3103-3121, 2006. http://dx.doi.org/10.1109/TNS.2006.885952
• Barnaby, H.J., Schrimpf, R.D., Sternberg, A.L., Berth, V., Cirba, C.R. and Pease, R.L., “Proton Radiation Response Mechanisms in Bipolar Analog Circuits”, IEEE Transactions on Nuclear Science, vol. 48, no. 6, p. 2074–2080, 2001. http://dx.doi.org/10.1109/23.983175
• Benfica, J., et al., “Analysis of SRAM-Based FPGA SEU Sensitivity to Combined Effects of Conducted EMI and TID”, IEEE, 2015,15th European Conf. on Radiation and Its Effects on Components and Systems (RADECS). Moscow, Russia. http://dx.doi.org/10.1109/RADECS.2015.7365584
• Carlin, N., et al., Nucl. Inst. andMethods in PhysicsResearch A 540, 215-221, 2005.
• Duzellier, S., “Radiation Effects on Electronic Devices in Space”, Aerospace Science and Technology 9, p. 93-99, 2005. http://dx.doi.org/10.1016/j.ast.2004.08.006
• ESA/SCC Basic specification n. 25100: Single Event Effects Test Method and Guidelines, ESA, Noordwijk, Netherlands, 1995.
• http://root.cern.ch/drupal/, last access 03/05/2016.
• http://www.srim.org/, last access 03/05/2016.
• Johnston, Allan. ReliabilityandradiationEffects inCompoundSemiconductors. World ScientificPublishingCo. Pte. Ltd., CaliforniaInstituteof Technology, USA. 2010.
• Medina, N.H., et al., “First Successful SEE Measurements in Brazil”, IEEE Radiation Effects Data Workshop (REDW), 2014, Paris, France. http://dx.doi.org/10.1109/REDW.2014.7004571
• Pelletron-LINAC Project, Internal Report DFN 01/1993.
• Tambara, L., et al., “Heavy ion induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC”. IEEE RadiationEffects Data Workshop (REDW), 2015, Moscow, Russia.
• Vargas, F., private report, 2016.